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Seite: Glossar

In diesem Glossar möchten wir Ihnen die wichtigsten Fachbegriffe erklären.

  • AES Auger electron spectroscopy
  • AFM Atomic force microscopy
  • EDS / EDX Energy dispersive spectrometry
  • EDX / EDS Energy dispersive X-ray
  • EELS Electron energy loss spectroscopy
  • EID Electron induced desorption
  • ESCA / XPS Electron spectroscopy for chemical analysis
  • GDOS Glow discharge optical spectroscopy
  • ISS Ion scattering spectroscopy
  • LAMMA Laser microprobe mass analysis
  • LEED Low energy electron diffration
  • PEEM Photo emission electron microscopy
  • REM / SEM Raster-Elektronenmikroskopie
  • RBS Rutherford backscattering
  • RFA X-ray fluoroscence analysis
  • RHEED Reflection high-energy electron diffraction
  • SAM Scanning auger mircroprobe
  • SE Secondary electron
  • SEM / REM Scanning electron microscopy
  • SIMS Secondary ion mass spectroscopy
  • SNMS Secondary neutral mass spectroscopy
  • TEM Transmission electron mikroscopy
  • ToF-SIMS Time of flight SIMS
  • UPS  Ultraviolet photoelectron spectroscopy
  • WDX / WDS Wavelength dispersive analysis of X-ray
  • XPS / ESCA X-ray photoelectron spectroscopy
  • ZAF Atomic number, absorption, and fluoroscence correctionis pattern

 

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